SCAP uses the US government’s National Vulnerability Database (NVD), which is a standards-based vulnerability management data repository. NVD includes databases of security checklists, security-related software flaws, misconfigurations, product names, and impact metrics. For more information on SCAP and NVD, go to the NIST websites at http://scap.nist.gov/index.html and http://nvd.nist.gov/.
Smart Labels are applied to and removed from managed devices when the appliance processes device inventory. So if you create a Smart Label that enables metering on devices, it might take time for the Smart Label to be applied to devices and for devices to report metering information. Metering is enabled for devices that match the Smart Label criteria only after devices are inventoried and the Smart Label is applied.